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A note on curvature and twist measurements using the Ligtenberg‐Moiré method
Author(s) -
FOSTER C. G.
Publication year - 1980
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.1980.tb00325.x
Subject(s) - curvature , twist , moiré pattern , line (geometry) , optics , mathematics , mathematical analysis , geometry , physics
In this note an alternative technique for measuring curvature and twist is discussed. The method relies on measuring the line spacing in a single exposure reflected pattern. Use of this technique appears to be preferable in many applications.