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The influence of wavelength in the X‐ray measurement of elastic stress
Author(s) -
DOIG P.,
FLEWITT P. E. J.
Publication year - 1977
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.1977.tb00239.x
Subject(s) - diffractometer , materials science , wavelength , anisotropy , optics , penetration (warfare) , x ray , radiation , stress (linguistics) , composite material , beam (structure) , penetration depth , physics , optoelectronics , engineering , scanning electron microscope , linguistics , philosophy , operations research
The X‐ray diffractometer method applied to the measurement of elastic stresses in mild steel is described. Chromium and cobalt radiation have been used to investigate the effect of X‐ray wavelength on the accuracy of the technique. Effects of elastic anisotropy and beam penetration have been considered.