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THEORETICAL ASPECTS OF RESIDUAL STRESS MEASUREMENTS BY X‐RAY DIFFRACTOMETRY
Author(s) -
KIRK D.
Publication year - 1970
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.1970.tb01654.x
Subject(s) - diffractometer , residual stress , residual , materials science , x ray , series (stratigraphy) , analytical chemistry (journal) , optics , computer science , algorithm , composite material , physics , chemistry , geology , environmental chemistry , scanning electron microscope , paleontology
This paper is the first in a series of three covering (1) theoretical considerations, (2) experimental features, and (J) practical applications of X‐ray diffractometer techniques to the accurate determination of residual macrostresses.