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CALIBRATION AND INSTRUMENTATION OF SEMICONDUCTOR STRAIN GAUGES
Author(s) -
PARKINS J. R.
Publication year - 1968
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/j.1475-1305.1968.tb01352.x
Subject(s) - strain gauge , instrumentation (computer programming) , calibration , semiconductor , gauge factor , strain (injury) , gauge (firearms) , materials science , measuring instrument , structural engineering , mechanical engineering , engineering , optoelectronics , physics , composite material , computer science , thermodynamics , metallurgy , fabrication , medicine , alternative medicine , pathology , quantum mechanics , operating system
Characteristics of semiconductor strain gauges are explored experimentally and a procedure is given for calculating the gauge factor for strain measurement on a given test material at a known temperature. Results of experiments on suitable instrumentation are presented.