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Longer term test–retest reliability of error‐related brain activity
Author(s) -
Weinberg Anna,
Hajcak Greg
Publication year - 2011
Publication title -
psychophysiology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.661
H-Index - 156
eISSN - 1469-8986
pISSN - 0048-5772
DOI - 10.1111/j.1469-8986.2011.01206.x
Subject(s) - psychology , error related negativity , trait , negativity effect , anterior cingulate cortex , audiology , reliability (semiconductor) , event related potential , developmental psychology , electroencephalography , cognitive psychology , cognition , neuroscience , medicine , power (physics) , physics , quantum mechanics , computer science , programming language
The error‐related negativity (ERN) is a negative deflection in the event‐related potential (ERP) following an erroneous response and is thought to reflect activity of the anterior cingulate cortex. There is accumulating evidence that the component has trait‐like properties; prior evidence further suggests test–retest reliability estimates ranging from .40 to .82 over a period of 2 to 6 weeks. The present study examined temporal stability over a longer time period. Error‐related brain activity was recorded from 26 subjects during an arrow version of the flankers task on two occasions separated by 1.5 to 2.5 years. Depending on the scoring method, test–retest reliability of the ERN ranged from .56 to .67. These data are consistent with previous suggestions that the ERN is a moderately stable, trait‐like neural measure.