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SCANNING ELECTRON MICROSCOPY OF SURFACE FEATURES OF EUCALYPT MYCORRHIZAS
Author(s) -
SEVIOUR R. J.,
HAMILTON D.,
CHILVERS G. A.
Publication year - 1978
Publication title -
new phytologist
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.742
H-Index - 244
eISSN - 1469-8137
pISSN - 0028-646X
DOI - 10.1111/j.1469-8137.1978.tb02275.x
Subject(s) - hypha , scanning electron microscope , botany , electron micrographs , biology , morphogenesis , electron microscope , biophysics , materials science , optics , physics , composite material , biochemistry , gene
SUMMARY Scanning electron micrographs of surface features are a useful aid for distinguishing mycorrhizas formed by different fungal components. Some of these features raise important questions about mycorrhizal morphogenesis and associated hyphal wall structure.

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