z-logo
Premium
Anti‐Aliased Lines Using Run‐Masks
Author(s) -
Diakopoulos Nicholas A.,
Stephenson Peter D.
Publication year - 2005
Publication title -
computer graphics forum
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 120
eISSN - 1467-8659
pISSN - 0167-7055
DOI - 10.1111/j.1467-8659.2005.00840.x
Subject(s) - computer science , line (geometry) , computer graphics (images) , graphics , digitization , pixel , line segment , algorithm , set (abstract data type) , computer vision , scan line , artificial intelligence , mathematics , programming language , geometry , grayscale
In recent work, a set of line digitization algorithms based on the hierarchy of runs in the digital line has unified and generalized the iterative line‐drawing algorithms used in computer graphics. In this paper, the additional structural information generated by these algorithms is leveraged to describe a run‐based approach to draw anti‐aliased line segments in which anti‐aliased run‐masks are substituted for the individual run lengths as the line is being drawn. The run‐masks are precomputed using a prefiltering technique such that one or more run‐masks are defined for each of the one or two possible run lengths that occur in the line. The run‐masks can be defined for any order or level of the hierarchy of runs in the digital line and the technique is illustrated using runs of pixels. Comparing the use of run‐masks to applying the prefiltering technique for each pixel in the line, a line of similar visual quality can be produced more efficiently. We place no restrictions on the placement of the end points of the line, which may reside anywhere on the two‐dimensional plane.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here