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Quantification of the skin's topography by skin profilometry
Author(s) -
COOK THOMAS H.,
CRAFT TRELIA J.,
BRUNELLE ROCCO L.,
NORRIS FRANK,
GRIFFIN WILLIAM A.
Publication year - 1982
Publication title -
international journal of cosmetic science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 62
eISSN - 1468-2494
pISSN - 0142-5463
DOI - 10.1111/j.1467-2494.1982.tb00314.x
Subject(s) - profilometer , surface finish , surface roughness , smoothness , optics , materials science , geology , mathematics , physics , composite material , mathematical analysis
Synopsis A method of skin profilometry is presented. The data generated using this method are used to (a) uncover sources of variation in skin profilometry, (b) provide information regarding the choice of roughness parameters best suited for characterizing the skin's topography, and (c) determine if skin profilometry is a valuable tool for quantitatively assessing changes in the skin's surface pattern. The data show the roughness parameter values to be dependent on the orientation of the tracings with regard to the major grooves and ridges present in the surface patterns. Large variabilities of roughness parameter values obtained for multiple scans within small areas of replicas are indicative of the nonhomogeneity of the skin's surface. The number of peaks, mean peak size, mean depth of roughness, depth of smoothness, and residual profile length appear to be the most utile roughness parameters for quantifying changes in the skin's topography. The ability of skin profilometry to detect subtle changes in the skin's surface pattern due to hydration indicates the method is a sensitive means of quantifying the skin's topography. Quantification de la topographie de la pedu par la profilométrie de la pedu