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RELIABILITY OF AUTOMATED INTELLIGENCE TESTING USING A THREE‐MONTH TEST‐RETEST INTERVAL 1
Author(s) -
ELWOOD DAVID L.
Publication year - 1973
Publication title -
applied psychology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.497
H-Index - 88
eISSN - 1464-0597
pISSN - 0269-994X
DOI - 10.1111/j.1464-0597.1973.tb00395.x
Subject(s) - reliability (semiconductor) , reliability engineering , test (biology) , interval (graph theory) , statistics , psychology , mathematics , physics , engineering , combinatorics , geology , paleontology , power (physics) , quantum mechanics