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Specific aspects on crack advance during J ‐test method for structural materials at cryogenic temperatures
Author(s) -
WEISS K.,
NYILAS A.
Publication year - 2006
Publication title -
fatigue and fracture of engineering materials and structures
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.887
H-Index - 84
eISSN - 1460-2695
pISSN - 8756-758X
DOI - 10.1111/j.1460-2695.2006.00963.x
Subject(s) - materials science , toughness , fracture toughness , test method , machining , structural engineering , crack growth resistance curve , work (physics) , j integral , fracture mechanics , composite material , crack closure , metallurgy , mechanical engineering , engineering , mathematics , statistics
Cryogenic elastic plastic, J ‐integral investigations on metallic materials often show negative crack extension values with respect to resistance curve J ‐ R . According to the present ASTM standard, the use of unloading compliance technique relies on the estimation procedure of the crack lengths during the unloading sequences of the test. The current standard, however, does not give any specific procedure for treating such negative data. To date, the applied procedure uses the shifting of the negative crack extension values either to the onset of the blunting line or to the offset of the resistance curve. The present paper represents a solution of the negative crack length problem on the basis of a mechanical evaluation procedure of the unloading slopes. The achieved progress using this evaluation technique is demonstrated on different materials such as cryogenic high toughness stainless steels, low carbon ferritic steel and aluminum alloys from the series of 7000 and 5000. In addition, this work deals with the crack tunnelling phenomenon, observed for high toughness materials, and shows the reduction of this crack extension appearance by using electro discharge machining (EDM) side groove technique. The differences between EDM processed side grooves and standard V‐notch machining have been investigated within these test series.