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Tokyo Child Development Schedule — I. Test‐Retest Reliability and Concurrent Validity —
Author(s) -
Kurita Hiroshi,
Uchiyama Tsutomu,
Takesada Masashi
Publication year - 1985
Publication title -
psychiatry and clinical neurosciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.609
H-Index - 74
eISSN - 1440-1819
pISSN - 1323-1316
DOI - 10.1111/j.1440-1819.1985.tb02896.x
Subject(s) - concurrent validity , reliability (semiconductor) , test (biology) , psychology , schedule , test validity , reliability engineering , clinical psychology , psychometrics , computer science , internal consistency , engineering , paleontology , power (physics) , physics , quantum mechanics , biology , operating system
The Tokyo Child Development Schedule (TCDS) consisting of 140 items divided into seven areas—gross motor, fine motor, self‐help, play, socialization, speech and comprehension‐cognition—was developed. Each item is checked by a caretaker of a child with a three‐point scale: pass, sometimes pass and fail. All of the seven areas and the entire portion of the TCDS exhibited a high grade of test‐retest reliability. All but two of the items showed good agreement between the results of the two‐time ratings. In 53 children with or without autistic features, the total scores on the TCDS and mental ages on the Japanese version of the Stanford‐Binet Intelligence Scale demonstrated the value of correlation coefficient ( r ) of 0.779.