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Analysis of Factors that Influence Kernel Weight of Wheat Infected by Septoria nodorum
Author(s) -
Scharen A. L.,
Lund R. E.,
DietzHolmes M. E.
Publication year - 1991
Publication title -
plant breeding
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 71
eISSN - 1439-0523
pISSN - 0179-9541
DOI - 10.1111/j.1439-0523.1991.tb00507.x
Subject(s) - septoria , biology , context (archaeology) , selection (genetic algorithm) , yield (engineering) , kernel (algebra) , agronomy , statistics , mathematics , computer science , paleontology , materials science , combinatorics , artificial intelligence , metallurgy
Several methods for determining yield reduction resulting from Septoria nodorum blotch have appeared in the literature during the past decade. These methods varied from the measurement of effects of disease on components of yield to calculation of area of symptoms on certain leaves at different growth stages. We analyzed data from a uniform group of wheat entries in the USDA Septoria nursery that had been grown in seven locations in North America and Europe during the years 1982–1987. Symptom severity and height of symptom on the plant were compared to kernel number and kernel weight. Location, year‐within‐location and genotype were also considered. In the context of this study, we concluded that location, and year‐within‐location are the most important factors determining yield reduction (as measured by relative kernel weight). Selection directly for components of yield is quite effective, but selection by means of disease symptoms is often not correlated with yield. We also conclude that specific methods for relating symptoms to yield reduction that are applicable to a particular location are probably useful and appropriate for that location only.