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An Improved Assessment Procedure for Breeding for Resistance to Septoria nodorum in Wheat
Author(s) -
Walther H.
Publication year - 1990
Publication title -
plant breeding
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 71
eISSN - 1439-0523
pISSN - 0179-9541
DOI - 10.1111/j.1439-0523.1990.tb00452.x
Subject(s) - septoria , biology , heritability , fungicide , cultivar , yield (engineering) , agronomy , breeding program , plant disease resistance , powdery mildew , poaceae , genetics , gene , materials science , metallurgy
A yield‐based assessment procedure for breeding for resistance to Septoria nodorum (SN) is presented. Artificially infected as well as fungicide‐protected plots were analyzed for each genotype. Considerable increase in precision of disease scores was gained by using an assessment matrix for different plant organs and time intervals during disease development. This technique resulted in yield loss: disease attack correlations up to r = 0.85:** and raised coefficients of heritability (h 2 b = broad sense heritability) with h 2 b = 0.72 for % yield loss and h 2 b = 0.86 for SN‐attack, calculated for a 3‐year replicated field experiment with 105 winter wheat cultivars.