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Rapid and Precise Detection of Latent Infections of Wheat Stripe Rust in Wheat Leaves using Loop‐Mediated Isothermal Amplification
Author(s) -
Huang Chong,
Sun Zhenyu,
Yan Jiahui,
Luo Yong,
Wang Haiguang,
Ma Zhanhong
Publication year - 2011
Publication title -
journal of phytopathology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.53
H-Index - 60
eISSN - 1439-0434
pISSN - 0931-1785
DOI - 10.1111/j.1439-0434.2011.01806.x
Subject(s) - loop mediated isothermal amplification , puccinia striiformis , biology , stripe rust , spore , inoculation , wheat leaf rust , dna , rust (programming language) , horticulture , botany , microbiology and biotechnology , genetics , gene , virulence , cultivar , plant disease resistance , computer science , programming language
Wheat stripe rust caused by Puccinia striiformis f.sp. tritici ( Pst ) is one of the most important diseases of wheat worldwide. Detection of latent infection in leaves is critical for estimating the initial inoculum potential of epidemics. A loop‐mediated isothermal amplification (LAMP) assay was developed and evaluated for the detection of Pst DNA in spores and wheat seedlings with latent infections. LAMP assay could detect as low as 2 pg/μl template DNA and detect latent infections from leaves as early as 24 h after inoculation. This provides a rapid and accurate method of estimating latent infection levels.