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The Grain Mold Pathogen, Fusarium thapsinum , Reduces Caryopsis Formation in Sorghum bicolor
Author(s) -
Little Christopher R.,
Magill Clint W.
Publication year - 2009
Publication title -
journal of phytopathology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.53
H-Index - 60
eISSN - 1439-0434
pISSN - 0931-1785
DOI - 10.1111/j.1439-0434.2008.01530.x
Subject(s) - panicle , sorghum , anthesis , caryopsis , biology , inoculation , cultivar , agronomy , fusarium , mold , glume , poaceae , horticulture , botany
Grain mold is a globally important panicle disease of sorghum [ Sorghum bicolor (L.) Moench] that occurs between floral anthesis and physiological maturity of the caryopsis. Many fungi, including Fusarium thapsinum , cause grain mold. In this study, sorghum florets of grain mold resistant (Sureno and Tx2911), moderately resistant (SC170), and susceptible (Tx430) cultivars were spray‐inoculated with a high density (1 × 10 6 microconidia/ml) of F. thapsinum at anthesis. Mean caryopsis formation frequencies [CFF = (total caryopses/total spikelets per panicle) × 100] for F. thapsinum ‐inoculated Sureno and Tx2911 panicles did not significantly differ from their respective controls, however F. thapsinum ‐inoculated SC170 and Tx430 panicles were significantly less than controls. In addition, CFF was significantly reduced in F. thapsinum ‐inoculated Tx430 panicles when compared to the F. thapsinum ‐inoculated grain mold resistant genotypes (P = 0.011). This study suggests that screening of sorghum varieties for caryopsis formation using high‐density inoculations at anthesis would provide an additional assay to measure F. thapsinum resistance in the greenhouse.