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Atomic Force Microscopy for Direct Imaging and Nanoscale Morphometry of the Rice False Smut Fungus Ustilaginoidea virens
Author(s) -
Kim K. W.
Publication year - 2006
Publication title -
journal of phytopathology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.53
H-Index - 60
eISSN - 1439-0434
pISSN - 0931-1785
DOI - 10.1111/j.1439-0434.2006.01175.x
Subject(s) - conidium , nanoscopic scale , atomic force microscopy , scanning electron microscope , biology , microscopy , materials science , surface roughness , surface finish , spore , optics , botany , nanotechnology , physics , composite material
Atomic force microscopy (AFM) was used for direct imaging and nanoscale morphometry of spined conidia of Ustilaginoidea virens . Basic components of AFM include a piezoscanner, a cantilever and a photodiode for surface scanning and image formation. Topographic imaging by AFM exhibited surface topographic images of ‘untreated’ conidia at the comparable spatial resolution with conventional scanning electron microscopy. Numerical analysis of the surface parameters over 1.0 × 1.0 μ m 2 scan areas revealed a variety of mean height (239.5 ± 124.7 nm), root‐mean‐squared roughness (78.2 ± 31.8 nm), surface area (1.8 ± 0.6 μ m 2 ), and volume (239.6 ± 124.7 nm 3 ) from acquired topographic images. These results suggest that AFM imaging and surface analysis can provide insights into a comprehensive understanding of fungal spores at the nanoscale level, opening a new venue in plant pathology and its related research areas.