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Effect of soft electron treatment on adzuki bean weevil, Callosobruchus chinensis (L.) (Col., Bruchidae)
Author(s) -
Rami Reddy P. V.,
Todoriki S.,
Miyanoshita A.,
Imamura T.,
Hayashi T.
Publication year - 2006
Publication title -
journal of applied entomology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.795
H-Index - 60
eISSN - 1439-0418
pISSN - 0931-2048
DOI - 10.1111/j.1439-0418.2006.01074.x
Subject(s) - callosobruchus chinensis , biology , fecundity , weevil , vigna , germination , pest analysis , horticulture , legume , toxicology , callosobruchus maculatus , botany , population , demography , sociology
Laboratory experiments were conducted to study the effect of soft electron (low‐energy electron) treatment on adzuki bean weevil, Callosobruchus chinensis (L.), a major pest of stored legume seeds. Adzuki bean ( Vigna angularis ) seeds containing weevils of different ages (0, 2, 4, 6, 8, 10, 12, 14, 16 and 18 days), were exposed to electrons at an acceleration voltage of 170 kV for 20 min (10 kGy). The radiation sensitivity of the insect decreased with increasing age. The egg stage was highly susceptible to electron radiation whereas the 18‐day‐old stage (fully developed adults ready for emergence) was the most tolerant, and treatment at a higher energy (200 kV equal to 10 kGy) was necessary to achieve an 80% mortality of this stage. However, the longevity, fecundity and fertility of the surviving adult insects were adversely affected by the electron treatment and they failed to complete their life cycle. The sex ratio of weevils was not significantly affected by the electron treatment, suggesting an equal vulnerability of both sexes. Electron treatment did not affect the germination capacity of adzuki bean seeds, so soft electron irradiation represents a safer method for the disinfestation of adzuki beans.