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Critical period of weed interference in chickpea
Author(s) -
MOHAMMADI G,
JAVANSHIR A,
KHOOIE F R,
MOHAMMADI S A,
ZEHTAB SALMASI S
Publication year - 2005
Publication title -
weed research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.693
H-Index - 74
eISSN - 1365-3180
pISSN - 0043-1737
DOI - 10.1111/j.1365-3180.2004.00431.x
Subject(s) - weed , agronomy , yield (engineering) , point of delivery , biology , crop , dry weight , weed control , field experiment , growing season , horticulture , metallurgy , materials science
Summary The critical period of weed interference in one variety of chickpea was determined in field experiments carried out at two sites, Tabriz 2002 and Kermanshah 2003, Iran. Chickpea culture was either kept free of weeds for 0, 12, 24, 36, 48 and 60 days after crop emergence (DAE) or weeds were allowed to grow for 0, 12, 24, 36, 48 and 60 DAE. In these experiments, chickpea yield increased with increasing duration of weed‐free period and was reduced by increasing duration of weed‐infested period. Unweeded conditions for the entire growing season caused 66.4% and 48.3% seed yield reduction when compared with the treatment that was weed‐free throughout the growing season, at Tabriz 2002 and Kermanshah 2003, respectively. The results indicated that chickpea must be kept weed‐free between the five‐leaf and full flowering stages (24–48 DAE) and from the four‐leaf to beginning of flowering stages (17–49 DAE) at the two sites, respectively, in order to prevent >10% seed yield loss. At both sites, reduction in seed yield, because of the increased weed interference period, was accompanied by simultaneous reduction in plant dry weight, number of branches, pods per plant and 100‐seed weight. This was supported by significant and positive correlations between these traits and chickpea seed yield. There was no significant correlation between the number of seeds per pod and seed yield. A linear regression model was used to describe the relationship between weed dry weight and seed yield loss.