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Interfacial ultramorphology of single‐step adhesives: nanoleakage as a function of time
Author(s) -
REIS A. F.,
BEDRANRUSSO A. K. B.,
GIANNINI M.,
PEREIRA P. N. R.
Publication year - 2007
Publication title -
journal of oral rehabilitation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.991
H-Index - 93
eISSN - 1365-2842
pISSN - 0305-182X
DOI - 10.1111/j.1365-2842.2006.01656.x
Subject(s) - adhesive , dentin , materials science , epoxy , composite material , dentistry , layer (electronics) , medicine
summary The aim of this study was to examine the effectiveness of single‐step self‐etching adhesives in preventing nanoleakage over a 90‐day water‐storage period, and analyse the ultramorphological characteristics of resin–dentin interfaces. Three single‐step self‐etching adhesives were evaluated: Adper Prompt L‐Pop – LP (3M ESPE), iBond – iB (Heraeus Kulzer), and Clearfil Tri‐S Bond – S3 (Kuraray). Bonded specimens were sectioned into 0·9‐mm thick slabs and stored in water for 1, 60 or 90 days. After the storage periods, a silver tracer solution was used to reveal nanometer‐sized spaces and evidence of degradation within resin–dentin interfaces. Epoxy resin‐embedded sections were prepared, and the interfaces observed with the TEM. Nanoleakage patterns were compared among adhesives and storage periods using image analysis software. Data were statistically analysed by two‐way anova and Tukey test. Nanoleakage was observed in all resin–dentin interfaces produced by the single‐step self‐etching adhesives. Results showed that LP presented the lowest silver deposition means at 1 day. However, after 60 and 90 days, the area of silver deposition significantly increased for LP. iB presented intense silver deposition after 1 day and a small increase after 90 days. S3 presented the lowest silver deposition means after 60 and 90 days of water‐storage.