Premium
Increased resolution in neutral atom microscopy
Author(s) -
WITHAM P. J.,
SÁNCHEZ E. J.
Publication year - 2012
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2012.03665.x
Subject(s) - resolution (logic) , microscope , atom (system on chip) , pinhole (optics) , energetic neutral atom , microscopy , materials science , molecule , chemistry , atomic physics , optics , physics , ion , organic chemistry , artificial intelligence , computer science , embedded system
Summary The neutral atom microscope uses a beam of thermal noncharged atoms or molecules to probe an atomic surface with very low interaction energies (<70 meV). Continued optimization of the ‘pinhole’ neutral atom microscope has improved resolution to 0.35 μm. Recent images are presented demonstrating resolution and the contrast mechanisms identified so far. The future potential for sub‐100 nm resolution is discussed.