Premium
Interferometer‐based structured‐illumination microscopy utilizing complementary phase relationship through constructive and destructive image detection by two cameras
Author(s) -
SHAO L.,
WINOTO L.,
AGARD D.A.,
GUSTAFSSON M.G.L.,
SEDAT J.W.
Publication year - 2012
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2012.03604.x
Subject(s) - interferometry , optics , beam splitter , interference microscopy , interference (communication) , wavefront , phase (matter) , microscope , path (computing) , physics , optical path , computer science , microscopy , perpendicular , computer vision , mathematics , laser , geometry , telecommunications , channel (broadcasting) , quantum mechanics , programming language
Summary In an interferometer‐based fluorescence microscope, a beam splitter is often used to combine two emission wavefronts interferometrically. There are two perpendicular paths along which the interference fringes can propagate and normally only one is used for imaging. However, the other path also contains useful information. Here we introduced a second camera to our interferometer‐based three‐dimensional structured‐illumination microscope (I 5 S) to capture the fringes along the normally unused path, which are out of phase by π relative to the fringes along the other path. Based on this complementary phase relationship and the well‐defined phase interrelationships among the I 5 S data components, we can deduce and then computationally eliminate the path length errors within the interferometer loop using the simultaneously recorded fringes along the two imaging paths. This self‐correction capability can greatly relax the requirement for eliminating the path length differences before and maintaining that status during each imaging session, which are practically challenging tasks. Experimental data is shown to support the theory.