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Backscattered electron detection in environmental SEM
Author(s) -
DANILATOS G.D.
Publication year - 2012
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2011.03559.x
Subject(s) - scintillator , photomultiplier , scanning electron microscope , optics , detector , scintillation , materials science , yttrium , yttrium aluminium garnet , electron , aluminium , optoelectronics , physics , laser , nuclear physics , composite material , metallurgy , oxide
Summary An examination of the backscattered electron imaging status in environmental scanning electron microscopy is presented with particular attention to the testing and use of cerium doped yttrium aluminium garnet and yttrium aluminium perovskite scintillation detectors. A comparison is made with plastic scintillating backscattered electron detectors used previously (Nuclear Enterprises type NE102A scintillator). Semi‐disk, strip and wedge shapes of these materials have been tested in conjunction with various light‐guide geometries. These systems have been combined with two different types of photomultipliers, which also play a critical role in the total detector efficiency. The advantage of increased light output from the monocrystal materials is gained only if matched with suitable light‐guides and photomultipliers. The associated problems are discussed and proposals for further work are made for the construction of most efficient backscattered electron detectors in the environmental scanning electron microscope.