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A novel method for acquiring large‐scale automated scanning electron microscope data
Author(s) -
SHIVELEY A.R.,
SHADE P.A.,
PILCHAK A.L.,
TILEY J.S.,
KERNS R.
Publication year - 2011
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2011.03524.x
Subject(s) - software , computer science , flexibility (engineering) , data acquisition , code (set theory) , source code , field (mathematics) , scale (ratio) , computer hardware , physics , operating system , statistics , mathematics , set (abstract data type) , quantum mechanics , pure mathematics , programming language
Summary Recent software and hardware advances in the field of electron backscatter diffraction have led to an increase in the rate of data acquisition. Combining automated stage movements with conventional beam control have allowed researchers to collect data from significantly larger areas of samples than was previously possible. This paper describes a LabVIEW™ and AutoIT © code which allows for increased flexibility compared to commercially available software. The source code for this software has been made available in the online version of this paper.