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Morphological properties of Ag 2 SeTe nano thin films prepared by thermal evaporation
Author(s) -
VIJAYAN C.,
SOUNDARARAJAN N.,
CHANDRAMOHAN R.,
DHANASEKARAN V.,
SUNDARAM K.,
NEYVASAGAM K.,
MAHALINGAM T.
Publication year - 2011
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2011.03500.x
Subject(s) - nano , evaporation , materials science , nanotechnology , thin film , thermal , chemical engineering , composite material , physics , engineering , thermodynamics , meteorology
Summary Semiconducting silver selenide telluride (Ag 2 SeTe) thin films were prepared with different thicknesses onto glass substrates at room temperature using thermal evaporation technique. The structural properties were determined as a function of thickness by X‐ray diffraction exhibiting no preferential orientation along any plane; however, the films are found to have peaks corresponding to mixed phase. The morphology of these films was studied using scanning electron microscope and atomic force microscopy respectively, and is reported. The morphological properties are found to be very sensitive to the thin film thickness. The composition of the films is also estimated using energy dispersive analysis using X‐rays and are also reported.