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Extension of imaging depth in two‐photon fluorescence microscopy using a long‐wavelength high‐pulse‐energy femtosecond laser source
Author(s) -
WANG C.,
QIAO L.,
HE F.,
CHENG Y.,
XU Z.
Publication year - 2011
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2011.03492.x
Subject(s) - femtosecond , optics , optical parametric amplifier , two photon excitation microscopy , penetration depth , laser , materials science , amplifier , parametric oscillator , wavelength , femtosecond pulse shaping , microscope , excitation , optical parametric oscillator , microscopy , photon , optoelectronics , fluorescence , optical amplifier , physics , cmos , quantum mechanics
Summary We experimentally demonstrate, for the first time to the best of our knowledge, two‐photon fluorescence imaging with a femtosecond optical parametric amplifier. In particular, we systematically compare the imaging depths of two‐photon fluorescence microscopes based on three different excitation sources, including a femtosecond oscillator, a femtosecond regenerative amplifier and the optical parametric amplifier. The results show that the optical parametric amplifier can greatly extend the penetration depth by approximately 227% as compared with that obtained with the femtosecond oscillator due to effective suppression of scattering at longer wavelength and enhanced excitation efficiency enabled by higher pulse energy.