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The symmetry of precession electron diffraction patterns
Author(s) -
MORNIROLI J.P.,
STADELMANN P.,
JI G.,
NICOLOPOULOS S.
Publication year - 2010
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03311.x
Subject(s) - precession , diffraction , symmetry (geometry) , electron diffraction , physics , intensity (physics) , ideal (ethics) , electron , optics , condensed matter physics , quantum mechanics , mathematics , geometry , philosophy , epistemology
Summary The integrated intensity of the diffracted beams present on microdiffraction precession patterns can be used to infer the ‘ideal’ symmetry, i.e. the symmetry which takes into account both the position and the intensity of the diffracted beams on a diffraction pattern. It is shown that this symmetry is connected with the 11 Laue classes on conventional electron precession patterns and with the centro‐ and non‐centrosymmetrical point groups on unconventional precession patterns obtained without ‘descan’.