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TEM characterization of the artefacts induced by FIB in austenitic stainless steel
Author(s) -
ANDRZEJCZUK M.,
PŁOCIŃSKI T.,
ZIELIŃSKI W.,
KURZYDŁOWSKI K.J.
Publication year - 2010
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03288.x
Subject(s) - characterization (materials science) , materials science , austenite , austenitic stainless steel , metallurgy , nanotechnology , corrosion , microstructure
Summary Transmission electron microscopy studies of the artefacts in the form of network of dislocations induced by focused ion beam technique in austenitic stainless steel have been performed. Images of the microstructure with different diffraction vector g were analyzed. Transmission electron microscopy investigations of the artefacts induced by focused ion beam machining in the austenite revealed set of parallel dislocations with edge character located near the free surface of the thin foils.