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Microstructure investigations of dental composite samples prepared by focused ion beam technique
Author(s) -
ANDRZEJCZUK M.,
SIEJKAKULCZYK J.,
LEWANDOWSKA M.,
KURZYDŁOWSKI K.J.
Publication year - 2010
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03278.x
Subject(s) - materials science , microstructure , fabrication , ceramic , composite number , composite material , cubic zirconia , scanning electron microscope , dental composite , yttrium , polymer , focused ion beam , transmission electron microscopy , ion , nanotechnology , metallurgy , chemistry , oxide , organic chemistry , medicine , alternative medicine , pathology
Summary In this study, microstructures of dental composites were observed using high resolution scanning transmission electron microscopy (HR STEM). Samples for these observations were prepared by focused ion beam system. Two kinds of dental composites were investigated: (1) polymer‐ceramic composite containing nano‐sized ceramic fillers and (2) ceramic‐polymer composite based on the nano‐structured yttrium stabilized zirconia. The first composite is a popular material for dental fillings whereas the second is used for the fabrication of fixed partial dentures. The results are discussed in terms of the evaluation of fabrication process of the composites.