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HAADF‐STEM analysis of layered double perovskite La 2 CuSnO 6 grown epitaxially
Author(s) -
HARUTA M.,
KOMATSU H.,
KURATA H.,
SHIMAKAWA Y.,
ISODA S.
Publication year - 2009
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03235.x
Subject(s) - scanning transmission electron microscopy , epitaxy , materials science , perovskite (structure) , substrate (aquarium) , transmission electron microscopy , crystallography , thin film , layer (electronics) , dark field microscopy , oxide , optics , nanotechnology , chemistry , microscopy , metallurgy , physics , geology , oceanography
Summary Structural observation of layered double perovskite oxide La 2 CuSnO 6 thin films grown epitaxially on SrTiO 3 is reported by high‐angle annular dark‐field scanning transmission electron microscopy (HAADF‐STEM). Particularly the transition layer at the interface was observed, and the first B site layer at the interface was found to be almost formed by the Cu atomic layer as the random structure, followed by formation of the layered structure. In addition, HAADF‐STEM images indicate that the thin film is not single crystalline, but some irregular structures were observed to grow around the interface near atomic steps of the substrate of SrTiO 3 . Therefore, the steps largely affect the growth process of the thin film.