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Application of electron backscatter diffraction to the study of phase transformations: present and possible future
Author(s) -
GOURGUESLORENZON A.F.
Publication year - 2009
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2009.03130.x
Subject(s) - electron backscatter diffraction , backscatter (email) , diffraction , phase (matter) , electron diffraction , computer science , remote sensing , optics , physics , geology , telecommunications , quantum mechanics , wireless
Summary This paper first underlines the main advantages, use and limitations of the electron backscatter diffraction technique from the viewpoint of phase transformations. To get a deeper understanding of physical mechanisms involved in phase transformations, several evolutions are now in progress to get an insight into both three‐dimensional and real‐time information. Two of them, in particular, improvement of data collection versus improvement of data processing are discussed in the second part of this paper.