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Characterization of precipitates size distribution: validation of low‐voltage STEM
Author(s) -
ACEVEDOREYES D.,
PEREZ M.,
VERDU C.,
BOGNER A.,
EPICIER T.
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.02082.x
Subject(s) - scanning transmission electron microscopy , dark field microscopy , materials science , characterization (materials science) , scanning electron microscope , transmission electron microscopy , phase (matter) , microscopy , optics , analytical chemistry (journal) , nanotechnology , chemistry , composite material , physics , chromatography , organic chemistry
Summary The size distribution of second phase precipitates is frequently determined using conventional transmission electron microscopy (CTEM). However, other techniques, which present different advantages, can also be used for this purpose. In this paper, we focus on high angle annular dark field (HAADF) in TEM and scanning TEM (STEM) in scanning electron microscopy (SEM) imaging modes. The mentioned techniques will be first described, then compared to more conventional ones for the measurement of carbides size distribution in two FeCV and FeCVNb model alloys. This comparative study shows that STEM in SEM, a technique much easier to undertake compared to TEM, is perfectly adapted for size distribution measurements of second phase particles, with sizes ranging between 5 and 200 nm in these systems.