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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAlO 3 /SrTiO 3 multilayers prepared by focused ion beam
Author(s) -
MONTOYA E.,
BALS S.,
VAN TENDELOO G.
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.02055.x
Subject(s) - physics

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