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Phase resolving microscopy by multi‐plane diffraction detection
Author(s) -
GRJASNOW A.,
WUTTIG A.,
RIESENBERG R.
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.02022.x
Subject(s) - microscopy , diffraction , phase (matter) , phase contrast microscopy , materials science , optics , plane (geometry) , physics , mathematics , geometry , quantum mechanics
Summary An easily applicable quantitative phase‐contrast microscopy is presented. A bright‐field microscope with a coherent illumination is used. Only a series of diffraction images is taken in different distances from the sample. For reconstruction, a conjugate gradient technique as a new variant of phase retrieval technique is developed. The technique is experimentally investigated in detail. A phase accuracy up to 0.07 rad or a height accuracy of 13 nm in transmission for a binary test sample is reached, respectively.