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Introduction
Author(s) -
TragerCowan Carolo,
Wilkinson Angus
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.01990.x
Subject(s) - electron backscatter diffraction , focused ion beam , texture (cosmology) , engineering physics , materials science , political science , engineering , computer science , metallurgy , microstructure , physics , artificial intelligence , ion , quantum mechanics , image (mathematics)
This article introduces papers arising from the 14th Conference and Workshop on Electron Backscatter Diffraction(EBSD): its applications and related techniques,which was held between the 26th and 28th of March 2007 in New Lanark,Scotland