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Linear spatio‐temporal characterization of a UV microscope objective for nonlinear imaging and spectroscopy by using two‐dimensional spectral interferometry
Author(s) -
AMIR W.,
DURFEE C. G.,
SCHAFER D. N.,
GIBSON E. A.,
KOST L.,
PRZEKWAS E.,
JIMENEZ R.,
SQUIER J. A.
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.01948.x
Subject(s) - interferometry , characterization (materials science) , optics , spectroscopy , microscope , nonlinear system , imaging spectroscopy , spectral imaging , microscopy , physics , multiphoton fluorescence microscope , materials science , fluorescence microscope , quantum mechanics , fluorescence
Summary Two‐dimensional Fourier transform spectral interferometry is used to characterize the spatio‐temporal aberrations of a UV microscope objective. The spatial and temporal profiles of a 420 nm, 38 fs pulse at the focus of a 0.32 NA UV objective are then deduced using a wave propagation code incorporating the measured aberrations.