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Beyond lock‐in analysis for volumetric imaging in apertureless scanning near‐field optical microscopy
Author(s) -
VOGELGESANG R.,
ESTEBAN R.,
KERN K.
Publication year - 2008
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2008.01913.x
Subject(s) - optics , signal (programming language) , microscopy , optical microscope , lock (firearm) , materials science , pixel , near field scanning optical microscope , demodulation , field (mathematics) , physics , computer science , scanning electron microscope , telecommunications , engineering , mechanical engineering , channel (broadcasting) , mathematics , pure mathematics , programming language
Summary Conventional apertureless scanning near‐field optical microscopy uses lock‐in demodulation techniques to filter higher harmonics from the periodically modulated optical signal. On the one hand, this signal notoriously may contain contaminating mechanical contributions; on the other, it reduces the available data to one number per pixel. Realizing that the vertically oscillating near‐field probe actually traverses a whole volume above the sample surface, we discuss a model to extend the data analysis in an attempt to better extract the optical information and to recover its three‐dimensional spatial distribution.