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Automated electron tomography with scanning transmission electron microscopy
Author(s) -
FENG JIANGLIN,
SOMLYO ANDREW P.,
SOMLYO AVRIL V.,
SHAO ZHIFENG
Publication year - 2007
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2007.01859.x
Subject(s) - electron tomography , scanning transmission electron microscopy , scanning confocal electron microscopy , transmission electron microscopy , electron , tomography , energy filtered transmission electron microscopy , conventional transmission electron microscope , materials science , scanning electron microscope , optics , electron microscope , nuclear magnetic resonance , physics , nuclear physics
Summary We report the successful implementation of a fully automated tomographic data collection system in scanning transmission electron microscopy (STEM) mode. Autotracking is carried out by combining mechanical and electronic corrections for specimen movement. Autofocusing is based on contrast difference of a focus series of a small sample area. The focus gradient that exists in normal images due to specimen tilt is effectively removed by using dynamic focusing. An advantage of STEM tomography with dynamic focusing over TEM tomography is its ability to reconstruct large objects with a potentially higher resolution.