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SEM investigation of interfacial dislocations in nickel‐base superalloys
Author(s) -
EPISHIN ALEXANDER,
LINK THOMAS,
NOLZE GERT
Publication year - 2007
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2007.01831.x
Subject(s) - materials science , superalloy , dislocation , transmission electron microscopy , superposition principle , scanning electron microscope , crystallography , nickel , etching (microfabrication) , composite material , microstructure , metallurgy , nanotechnology , chemistry , layer (electronics) , physics , quantum mechanics
Summary A new technique for investigation of interfacial dislocations in nickel‐base superalloys by scanning electron microscopy is presented. At high temperatures the pressure of interfacial dislocations against the γ/γ′‐interface causes grooves. This ‘fingerprint of the dislocation network’ is visualized by deep selective etching, which removes the γ′‐phase down to the γ/γ′‐interface. Compared with transmission electron microscopy, the proposed method has important advantages: observation of large sample areas, no superposition of dislocations lying in different specimen depths, possibility of three‐dimensional view of dislocation configurations, information about the dislocation mobility, reduced time for preparation and visualization. The method can be applied for multiphase materials where the interface is grooved by interfacial dislocations.