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The interpretation of indexing of high Σ CSL grain boundaries from ceramics
Author(s) -
SHIH SHAOJU,
PARK MYUNGBEOM,
COCKAYNE DAVID J. H.
Publication year - 2007
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2007.01815.x
Subject(s) - electron backscatter diffraction , polishing , grain boundary , materials science , ceramic , crystallite , orientation (vector space) , kikuchi line , interpretation (philosophy) , diffraction , electron diffraction , mineralogy , reflection high energy electron diffraction , computer science , geology , optics , metallurgy , geometry , physics , microstructure , mathematics , programming language
Summary Electron backscatter diffraction (EBSD) is a useful technique for measuring the orientation of individual grains and for determining grain boundary misorientations in polycrystals. However, its application to ceramics is more difficult than to metals, because the surface quality that can be achieved often makes the Kikuchi patterns blurred. As a consequence, it can be difficult, even for automated systems, to differentiate between different grain orientations, which have similar patterns. In this paper, we carry out EBSD analyses of SrTiO 3 polycrystalline material prepared with different polishing methods, and we consider the effect of different criteria in interpreting the EBSD patterns from them. In particular, we investigate the CSL statistics using both the Palumbo and Aust and the Brandon criteria in this situation.