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Determination of pattern centre in EBSD using the moving‐screen technique
Author(s) -
CARPENTER D. A.,
PUGH J. L.,
RICHARDSON G. D.,
MOONEY L. R.
Publication year - 2007
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2007.01807.x
Subject(s) - electron backscatter diffraction , materials science , metallurgy , microstructure
Summary The ‘moving‐screen’ or ‘pattern magnification’ method of calibration for electron backscatter diffraction (EBSD) was reformulated to develop a high‐precision technique requiring no crystallographic knowledge of the specimen and no initial estimates of the calibration parameters. The technique depends upon the accurate displacement of the screen and camera assembly. Corresponding points are selected, interactively, from EBSD patterns. It is suggested that, as an alternative, the selection of points from the Hough transform could lead to a completely automated routine.