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A technique for improved focused ion beam milling of cryo‐prepared life science specimens
Author(s) -
HAYLES M. F.,
STOKES D. J.,
PHIFER D.,
FINDLAY K. C.
Publication year - 2007
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2007.01775.x
Subject(s) - focused ion beam , materials science , ion beam , scanning electron microscope , sample preparation , nanoscopic scale , ion , deposition (geology) , beam (structure) , electron beam induced deposition , nanotechnology , ion milling machine , layer (electronics) , analytical chemistry (journal) , optics , composite material , chemistry , chromatography , scanning transmission electron microscopy , paleontology , physics , organic chemistry , sediment , biology
Summary The combination of focused ion beam and scanning electron microscopy with a cryo‐preparation/transfer system allows specimens to be milled at low temperatures. However, for biological specimens in particular, the quality of results is strongly dependent on correct preparation of the specimen surface. We demonstrate a method for deposition of a protective, planarizing surface layer onto a cryo‐sample, enabling high‐quality cross‐sectioning using the ion beam and investigation of structures at the nanoscale.