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Microstructure evolution and strain localization in Cu and Cu‐8Al single crystals subjected to channel‐die compression
Author(s) -
LEWANDOWSKA MAŁGORZATA,
S̀WIĄTNICKI WIESŁAW,
PIĄTKOWSKI ANDRZEJ,
JASIEǸSKI ZDZISŁAW
Publication year - 2006
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2006.01648.x
Subject(s) - microstructure , materials science , transmission electron microscopy , dislocation , deformation (meteorology) , die (integrated circuit) , single crystal , crystallography , compression (physics) , composite material , severe plastic deformation , nanotechnology , chemistry
Summary Single crystals of pure Cu and Cu‐8%Al with two initial orientations, {112}〈111〉 and {112}〈110〉, were subjected to monotonic compression in channel‐die at room temperature (293 K). The dislocation microstructure and local crystallography were investigated by transmission electron microscopy after different amounts of deformation. Various factors, such as initial single crystal orientation, chemical composition and amount of plastic deformation, were analysed in order to determine their influence on the microstructure evolution, local orientation variations and strain localization phenomena.