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Analytical transmission electron microscopy and electron diffraction for characterization of multiphase Ni‐P‐Ti surface layer on Ti‐6Al‐4V alloy
Author(s) -
CZYRSKAFILEMONOWICZ A.,
BUFFAT P. A.
Publication year - 2006
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2006.01644.x
Subject(s) - transmission electron microscopy , microstructure , alloy , materials science , scanning electron microscope , layer (electronics) , electron diffraction , diffraction , high resolution transmission electron microscopy , titanium alloy , metallurgy , surface layer , crystallography , microscopy , electron microscope , analytical chemistry (journal) , composite material , optics , chemistry , nanotechnology , physics , chromatography
Summary The microstructure, chemical and phase composition of the hard Ni‐P‐Ti layer formed on the Ti‐6Al‐4V alloy after duplex surface treatment were investigated by light microscopy, X‐ray diffraction, scanning electron microscopy and analytical/high‐resolution transmission electron microscopy. These investigations showed that the improved mechanical and tribological properties of the surface‐treated alloy were related to the presence of a multilayered microstructure containing several phases from the Ni‐Ti‐P‐Al system.