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Identification and quantification of microstructures formed during nanocrystallization of amorphous (Fe, Co)‐Nb‐(Si, B) systems
Author(s) -
DEANKO M.,
KEPAPTSOGLOU D. M.,
MULLER D.,
JANICKOVIC D.,
SKORVANEK I.,
HRISTOFOROU E.,
SVEC P.
Publication year - 2006
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2006.01638.x
Subject(s) - materials science , nucleation , transmission electron microscopy , amorphous solid , microstructure , amorphous metal , grain size , quenching (fluorescence) , analytical chemistry (journal) , electron diffraction , phase (matter) , nanostructure , diffraction , crystallography , metallurgy , nanotechnology , alloy , chemistry , optics , physics , organic chemistry , chromatography , fluorescence
Summary The effect of addition of Si and variation of the Fe/Co ratio on the evolution of the nanostructure was studied in a modification of the Fe–Nb–B system. The entire system (Fe, Co) 73 Nb 7 (Si, B) 20 was prepared in an amorphous state by rapid quenching using the planar flow casting method over a wide range of Fe/Co atomic ratios, ranging from 0 to 1. Nanocrystallization was investigated by evolution of the electrical resistivity with time and temperature. The microstructural analysis was performed using transmission electron microscopy as well as electron and X‐ray diffraction. The results from microscopy observations were used to determine the distribution of grain size, which in these alloys attain very small dimensions of ∼5–8 nm. New algorithms of microscope image analysis were used for grain size determination, crucial for quantifying the microprocesses controlling nucleation and growth from the amorphous rapidly quenched phase.