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Preparation of TEM samples of metal–oxide interface by the focused ion beam technique
Author(s) -
ABOLHASSANI S.,
GASSER PHILIPPE
Publication year - 2006
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2006.01599.x
Subject(s) - transmission electron microscopy , oxide , focused ion beam , materials science , metal , irradiation , ion beam , sample preparation , homogeneous , ion , interface (matter) , nanotechnology , optics , beam (structure) , analytical chemistry (journal) , chemistry , composite material , metallurgy , chromatography , physics , capillary number , capillary action , organic chemistry , nuclear physics , thermodynamics
Summary This paper describes a procedure to prepare metal–oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal–oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.