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The characterization of low‐angle boundaries by EBSD
Author(s) -
BATE P. S.,
KNUTSEN R. D.,
BROUGH I.,
HUMPHREYS F. J.
Publication year - 2005
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2005.01513.x
Subject(s) - electron backscatter diffraction , misorientation , characterization (materials science) , materials science , diffraction , angular resolution (graph drawing) , resolution (logic) , orientation (vector space) , optics , limiting , electron diffraction , microstructure , geometry , physics , grain boundary , composite material , computer science , mathematics , nanotechnology , mechanical engineering , engineering , combinatorics , artificial intelligence
Summary A method of accurately measuring misorientations by electron backscatter diffraction (EBSD), which is an extension of that proposed by Wilkinson and based on the comparison of diffraction patterns, is described. The method has been applied to linescans, and found to improve the angular resolution by a factor of more than 30. The consequent improvement in determining misorientation axes is also analysed. Small changes of orientation very close to some low‐angle boundaries were investigated and found to be artefacts of the analysis. Measurements of the area from which diffraction patterns are generated show this to be much larger than the effective spatial resolution of EBSD, and it is concluded that this may be a limiting factor in the use of EBSD for microstructural characterization.