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Characterization of polymer thin films by phase‐sensitive acoustic microscopy and atomic force microscopy: a comparative review
Author(s) -
NGWA W.,
LUO W.,
KAMANYI A.,
FOMBA K. W.,
GRILL W.
Publication year - 2005
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2005.01484.x
Subject(s) - characterization (materials science) , microscopy , atomic force microscopy , phase (matter) , phase imaging , thin film , materials science , polymer , nanotechnology , phase contrast microscopy , optics , chemistry , physics , composite material , organic chemistry
Summary The potential of phase‐sensitive acoustic microscopy (PSAM) for characterizing polymer thin films is reviewed in comparison to atomic force microscopy (AFM). This comparison is based on results from three‐dimensional vector contrast imaging and multimodal imaging using PSAM and AFM, respectively. The similarities and differences between the information that can be derived from the AFM topography and phase images, and the PSAM phase and amplitude micrographs are examined. In particular, the significance of the PSAM phase information for qualitative and quantitative characterization of the polymer films is examined for systems that generate surface waves, and those that do not. The relative merits, limitations and outlook of both techniques, individually, and as a complementary pair, are discussed.