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Fluorescent resolution target for super‐resolution microscopy
Author(s) -
Stark P. R. H.,
Rinko L. J.,
Larson D. N.
Publication year - 2003
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.2003.01257.x
Subject(s) - resolution (logic) , fluorescence , microscopy , fluorescence microscope , super resolution microscopy , chemistry , materials science , optics , computer science , physics , artificial intelligence
Summary Historically, resolution in fluorescence optical microscopy has been limited by the Rayleigh criterion. Recently, however, several techniques have achieved resolution below that specified by the Rayleigh criterion. Among these are 4‐Pi confocal microscopy, harmonic excitation light‐microscopy, stimulated emission depletion microscopy, near‐field scanning optical microscopy and I 5 M. The most widely accepted current method of resolution testing is to image an array of closely packed fluorescent beads or beads dispersed in a matrix. This shows that the system is capable of resolving a feature with a given diameter; however, it does not demonstrate the classical resolution of the system. We have fabricated a fluorescent resolution target for better characterization of a system's resolution.