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Energy‐filtered Fresnel contrast analysis of Fe/Cu multilayers
Author(s) -
DUNINBORKOWSKI R. E.,
BOOTHROYD C. B.,
LLOYD S. J.,
STOBBS W. M.
Publication year - 1995
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1995.tb03685.x
Subject(s) - contrast (vision) , optics , image contrast , energy (signal processing) , scattering , materials science , transmission electron microscopy , low energy electron microscopy , inelastic scattering , transmission (telecommunications) , fresnel diffraction , electron microscope , physics , diffraction , computer science , telecommunications , quantum mechanics
SUMMARY Energy‐filtered imaging in the transmission electron microscope is applied to the Fresnel contrast exhibited by a fine‐period Fe/Cu multilayer. Comparisons of filtered and unfiltered image series demonstrate the effects of inelastic scattering, and it is shown that the use of energy filtering allows improved confidence in the physical origins of the contrast for a specimen, such as that described, for which the structure is still uncertain.