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Holographic measurement of the wave aberration of an electron microscope by means of the phases in the Fourier spectrum
Author(s) -
FU Q.,
LICHTE H.
Publication year - 1995
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1995.tb03620.x
Subject(s) - holography , optics , electron microscope , microscope , resolution (logic) , fourier transform , physics , contrast transfer function , electron holography , electron , materials science , spherical aberration , computer science , quantum mechanics , artificial intelligence , lens (geology)
SUMMARY The resolution limit achievable by holographic correction of the aberrations of an electron microscope depends critically on the information available about the microscope parameters when the hologram was taken. The measuring technique based on symmetry relations of the phases in the Fourier spectrum of the reconstructed electron wave is outlined and experimentally tested.